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Suzuki, Kenji*; Kura, Komoe*; Miura, Yasufumi*; Shiro, Ayumi*; Toyokawa, Hidenori*; Saji, Choji*; Kajiwara, Kentaro*; Shobu, Takahisa
Zairyo, 71(12), p.1005 - 1012, 2022/12
This paper describes a stress measurement from a welded part of an austenitic stainless steel using synchrotron X-rays. Difficulty measuring the X-ray stress of the welded part is caused by the broadening of the diffraction spot in the radial and circumferential directions. The bending strains of the rectangular bar made of the welded part were measured using synchrotron white X-rays and the double exposure method. To improve the energy resolution, monochromatic synchrotron X-ray of 70 keV was used. The diffraction pattern showed the sharp arc like a pattern from texture material. The diffraction profile was obtained from the integral of the diffraction intensity in the direction of the circumference. The diffraction angle was determined using the double exposure method. As a result, the distribution of the residual stresses of the welded part could be measured.
Suzuki, Kenji*; Yamada, Minami*; Shiro, Ayumi*; Shobu, Takahisa; Toyokawa, Hidenori*; Saji, Choji*
Zairyo, 71(4), p.347 - 353, 2022/04
We have already succeeded in the residual stress of aluminum alloys using the double exposure method (DEM) with 30 keV synchrotron radiation X-rays. However, the DEM has not be applied in the range of high-energy synchrotron X-rays. In this study, the stress measurements of a shrink-fitted ring using the DEM with synchrotron monochromatic X-rays beyond about 70 keV were performed. A CdTe pixel detector and a CCD camera were used as a detector. The shrink-fitted specimen of SUS304 was quasi-coarse grains of 43 micro-meters, and the diffraction rings were spotty. Despite quasi-coarse grains, it was possible to measure the stresses of the shrink-fitted specimen using the DEM. As a result, the DEM is excellent method to measures the stress for coarse grained materials. In addition, it is better to make the length between the detection positions longer to improve precision of the DEM. On the other hand, it was ineffective to increase the positions of detection.
Suzuki, Kenji*; Shiro, Ayumi*; Toyokawa, Hidenori*; Saji, Choji*; Shobu, Takahisa
Quantum Beam Science (Internet), 4(3), p.25_1 - 25_14, 2020/09
It is difficult to evaluate stress by the strain scanning method using a conventional diffractometer and a point detector since the two-dimensional diffraction pattern of a material composed of coarse grains does not have a ring but a spotty. To solve this problem, we proposed a double exposure method using a two-dimensional detector and monochromatized X-rays. In this study, we have developed a technique to apply that technique to white X-rays. The diffraction obtained by irradiating white X-rays for a material with of coarse grains becomes a Laue spot. Therefore, we have carried out developing a CdTe pixel two-dimensional detector that can limit the energy to be detected, and we evaluated the stress using that detector. As a result, we succeeded to measure the strain distribution of a bending specimen made to austenitic stainless steel. In the future, we would like to improve this technology and apply it to actual machine materials.
Suzuki, Kenji*; Shobu, Takahisa; Shiro, Ayumi*
Zairyo, 68(4), p.312 - 317, 2019/04
Materials after thermal processing such as welding often have coarse grains. To understand the residual stress after processing is very important from the viewpoint of the soundness of the structure. In this study, we proposed a double exposure method that combines a two-dimensional detector and high-energy synchrotron radiation as an X-ray stress measurement method for materials with coarse grains, and confirmed its practicality. As a result of measuring the residual stress of the plastic bending specimen and the indentation specimen of the aluminum alloy (A5052), the effectiveness of this measurement method was clarified because the residual stress distribution was in good agreement with the finite element analysis.
